The following is the Lloyd Diagram presentation made at the 2012 ASQ World Conference in Anaheim, CA.
Simply click on the below link to either open the file or download it.
Lloyd Root Cause Pattern Diagrams are a data mining technique that takes complaint and/or failure codes for products in combination with their date of manufacture and time to failure in order to quickly plot graphical data patterns that indicate their root cause area.
  • Lloyd Diagrams are capable of identifying the root causes of elusive NTF issues.
  • They are also capable of analyzing many transactional issues (see example below)